Characterization of liquid-phase epitaxially grown HgCdTe films by magnetoresistance measurements
- 1 September 1995
- journal article
- research article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 24 (9) , 1305-1310
- https://doi.org/10.1007/bf02653089
Abstract
No abstract availableKeywords
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- Inhomogeneity model for anomalous Hall effects in n-type Hg0.8Cd0.2Te liquid-phase-epitaxy filmsJournal of Applied Physics, 1985
- Effect of Random Inhomogeneities on Electrical and Galvanomagnetic MeasurementsJournal of Applied Physics, 1960