Thickness dependence of the electrical conductivity in vacuum deposited copper films
- 1 January 1969
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
- Vol. 57 (11) , 2073-2075
- https://doi.org/10.1109/PROC.1969.7470
Abstract
The size dependence of the conductivity observed in vacuum condensed copper films 200-1500 Å thick was interpreted by applying the Sondheimer theory on the assumption that the scattering of the carriers by the film boundaries is partially elastic. The fraction of electrons specularly reflected at the surfaces was determined by a method based on the anomalous skin effect.Keywords
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