Real-time observation of oxidation and photo-oxidation of rubrene thin films by spectroscopic ellipsometry

Preprint

20 March 2007

preprint
Published by arXiv in arXiv

https://doi.org/10.48550/arXiv.cond-mat/0703522

Abstract

We follow in real-time and under controlled conditions the oxidation of the organic semiconductor rubrene grown on SiO_2 using spectroscopic ellipsometry. We derive the complex dielectric function epsilon_1 + i epsilon_2 for pristine and oxidized rubrene showing that the oxidation is accompanied by a significant change of the optical properties, namely the absorption. We observe that photo-oxidation of rubrene is orders of magnitude faster than oxidation without illumination. By following different absorption bands (around 2.5eV and 4.0eV for pristine rubrene and around 4.9eV for oxidized rubrene) we infer that the observed photo-oxidation of these films involves non-Fickian diffusion mechanisms.

Keywords

All Related Versions

Version 1, 2007-03-20, ArXiv

This publication has 0 references indexed in Scilit: