Analysis of coatings and thin films using energetic ions
- 17 December 1979
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 64 (3) , 403-407
- https://doi.org/10.1016/0040-6090(79)90323-7
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- The use of 12C(d, p)13C and 16O(d, p)17O reactions to profile carbon and oxygen in solidsNuclear Instruments and Methods, 1978
- A Hybrid Pulse Pile-Up Rejection System as Applied to Rutherford BackscatteringIEEE Transactions on Nuclear Science, 1977