Determination of back interface state distribution in fully depleted SOI MOSFETs

Publisher Website

9 December 2002

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iedm.1991.235386

Abstract

No abstract available

Keywords

This publication has 8 references indexed in Scilit:

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Subthreshold slope in thin-film SOI MOSFETs
IEEE Transactions on Electron Devices, 1990
Short-channel effect in fully depleted SOI MOSFETs
IEEE Transactions on Electron Devices, 1989
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Performance Advantages of Submicron Silicon-On-Insulator Devices for ULSI
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IEEE Electron Device Letters, 1986
Threshold voltage of thin-film Silicon-on-insulator (SOI) MOSFET's
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