Measurements of oscillator strength for use in elemental analysis
- 1 November 1992
- journal article
- Published by Taylor & Francis in Philosophical Magazine Part B
- Vol. 66 (5) , 697-709
- https://doi.org/10.1080/13642819208207668
Abstract
Electron-energy-loss spectroscopy (EELS) in a conventional transmission electron microscope has been used to measure inner-shell cross-sections for aluminium, silver, indium, tin, antimony, tellurium and hafnium, using elemental thin films of known mass-thickness as standards. The results are presented in the form of differential and integral (dipole) oscillator strengths, in order to make them more widely useful for elemental microanalysis by EELS or X-ray absorption spectroscopy, and allowing comparison with previous experimental data and with the predictions of atomic theory.Keywords
This publication has 17 references indexed in Scilit:
- Atomic subshell photoionization cross sections and asymmetry parameters: 1 ⩽ Z ⩽ 103Published by Elsevier ,2004
- The influence of lens chromatic aberration on electron energy-loss spectroscopy quantitative measurementsMicroscopy Research and Technique, 1992
- Detection and quantification of low energy, low level electron energy loss edgesMicroscopy Microanalysis Microstructures, 1991
- On the effect of objective lens chromatic aberration on quantitative Electron-Energy-Loss Spectroscopy (EELS)Ultramicroscopy, 1989
- A single-stage process for quantifying electron energy-loss spectraUltramicroscopy, 1985
- Inner shell edge profiles in electron energy loss spectroscopyUltramicroscopy, 1985
- Low-energy x-ray interaction coefficients: Photoabsorption, scattering, and reflectionAtomic Data and Nuclear Data Tables, 1982
- Survey of photon-attenuation-coefficient measurements 10 eV to 100 GeVAtomic Data and Nuclear Data Tables, 1971
- Photo-Ionization Cross Sections of the Elements Helium to XenonPhysical Review B, 1968
- Differential Inelastic Scattering of Relativistic Charged ParticlesPhysical Review B, 1956