Minimum Ionizing Particle Detection by Secondary Electron Emission
- 1 January 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 24 (1) , 299-301
- https://doi.org/10.1109/tns.1977.4328693
Abstract
The use of secondary electron emission to detect high energy particles is investigated. Low density KCl layers have been tested to detect MeV electrons, 400-750 MeV protons and high energy deuterons. The efficiency and the secondary electron spectrum are presented. The results justify the use of low-density KCl layer to detect minimum ionizing particles.Keywords
This publication has 1 reference indexed in Scilit:
- The investigation of controllable secondary electron emission from single particlesNuclear Instruments and Methods, 1974