Specular Reflectance Curves of Wax-Polished Painted Surface: Determination of Wax-Film Thickness and rms Roughness
- 1 October 1967
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 6 (10)
- https://doi.org/10.1143/jjap.6.1198
Abstract
The reflectance curves of wax-polished painted surface, for p-polarized light of three wavelengths (641, 548 and 435 mµ), near the Brewster angle are classified into three groups. They are analyzed in connection with varied states of wax spread on the painted surface. The analysis is based on an expression introduced in the preceding paper for the specular reflectance of a uniformly filmed rough plane surface. The following results are given: When the wax-film is uniform in thickness its thickness lies between 750 and 400 Å, and the surface becomes partially filmed when the thickness is below 400 Å. The rms roughness of the painted surface is 400∼500 Å.Keywords
This publication has 1 reference indexed in Scilit:
- Reflection of Light from Filmed Rough Surface: Determination of Film Thickness and rms RoughnessJapanese Journal of Applied Physics, 1967