Precision Physical Measurements and Nanometrology

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Abstract
Precision measurements at the National Research Laboratory of Metrology used to determine fundamental constants and to test physical theory are described: they are related to the determination of silicon lattice spacing; the magnetic flux quantum; and a search for the fifth force. Equipment and techniques for nanometrology are described in terms of the nanoscale, nanoguide and nanodrive, all of which have immediate applications in advanced technology. An example is introduced which demonstrates the power of the scanning tunnelling microscope (STM) in nanometrology.

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