Cross-sectional transmission electron microscopy study of obliquely evaporated silicon oxide thin films
- 1 February 1986
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 136 (2) , L35-L38
- https://doi.org/10.1016/0040-6090(86)90292-0
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- The temperature dependence of liquid-crystal tilt anglesJournal of Applied Physics, 1984
- A scanning electron microscope study of columnar topography and liquid-crystal alignment on obliquely deposited oxide surfaces at low ratesApplied Physics Letters, 1980
- Topography of obliquely evaporated silicon oxide films and its effect on liquid-crystal orientationIEEE Transactions on Electron Devices, 1977
- Topology of obliquely coated silicon monoxide layersJournal of Applied Physics, 1977
- Effect of Substrate Surface on Alignment of Liquid Crystal MoleculesJapanese Journal of Applied Physics, 1976
- Tilt angle measurements of nematic phases of cyano-biphenyls aligned by obliquely evaporated filmsJournal of Physics D: Applied Physics, 1976
- Thin film surface orientation for liquid crystalsApplied Physics Letters, 1972
- Small Angle Electron Scattering from Vacuum Condensed Metallic Films II. Experimental ResultsPhysica Status Solidi (b), 1967