Investigation of soft error rate including multi-bit upsets in advanced SRAM using neutron irradiation test and 3D mixed-mode device simulation
- 19 April 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Cosmic ray neutron-induced soft errors in sub-half micron CMOS circuitsIEEE Electron Device Letters, 1997