IONIZATION SPECTROSCOPY OF SURFACES
- 15 February 1970
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 16 (4) , 179-181
- https://doi.org/10.1063/1.1653152
Abstract
A technique is described for the analysis of surface composition on the basis of characteristic loss features associated with electron impact ionization of inner atomic levels. The method involves separating the characteristic loss spectrum from the total secondary emission spectrum by superimposing a small oscillation on the primary beam energy and detecting only those features which fluctuate at the same frequency. Ionization spectroscopy is shown to have a number of inherent advantages over conventional Auger spectroscopy.Keywords
This publication has 5 references indexed in Scilit:
- AUGER EXCITATION BY INTERNAL SECONDARY ELECTRONSApplied Physics Letters, 1969
- OPTIMIZATION OF AUGER ELECTRON SPECTROSCOPY IN LEED SYSTEMSApplied Physics Letters, 1968
- Analysis of Materials by Electron-Excited Auger ElectronsJournal of Applied Physics, 1968
- Characteristic Electron Energy Loss Spectra of Some Alkali Metals and Alkaline EarthsProceedings of the Physical Society, 1962
- Characteristic Electron Energy Loss Spectra of the Transition Metals, Ti to CuProceedings of the Physical Society, 1960