Microstructure Development in RuO2‐Glass Thick‐Film Resistors and Its Effect on the Electrical Resistivity
- 1 July 1990
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 73 (7) , 1953-1957
- https://doi.org/10.1111/j.1151-2916.1990.tb05251.x
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Effect of atmosphere on the electrical conductivity of RuO2 and ruthenate layersJournal of Materials Science Letters, 1984
- The Microstructure of RuO2Thick Film Resistors and the Influence of Glass Particle Size on their Electrical PropertiesIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1984
- Effect of Glass‐Frit Size Distribution on the Microstructure of RuO2‐Based Thick‐Film ResistorsJournal of the American Ceramic Society, 1982