Phase determination in bright-field electron microscopy using complementary half-plane apertures
- 1 March 1974
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 7 (4) , L63-L64
- https://doi.org/10.1088/0022-3727/7/4/102
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Phase determination from image intensity measurements in bright-field opticsJournal of Physics D: Applied Physics, 1974