Remeasurement of a Silicon lattice period
Open Access
- 1 June 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. IM-36 (2) , 166-169
- https://doi.org/10.1109/TIM.1987.6312661
Abstract
Opitcal interferometry of an Silicon lattice period is an important link between macroscopic and microscopic lengths as well as between low-energy and high-energy spectroscopies. An evident discrepancy between two pre-1982 measurements has limited the effective application of these results. Very recent results, reported here in a preliminary way, appear to further understanding and removing this discrepancy.Keywords
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