Radioisotope x-ray fluorescence spectrometer with a high-resolution semiconductor detector. Analytical sensitivity for elements in low-atomic-number matrixes
- 1 February 1969
- journal article
- Published by American Chemical Society (ACS) in Analytical Chemistry
- Vol. 41 (2) , 337-342
- https://doi.org/10.1021/ac60271a006
Abstract
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