Quantitative XPS — multiline approach
- 31 December 1986
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 40 (3) , 241-257
- https://doi.org/10.1016/0368-2048(86)80023-8
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- On the influence of elastic scattering on asymmetric xp-signal distributionJournal of Electron Spectroscopy and Related Phenomena, 1985
- A modified bias-method for the determination of spectrometer functionsJournal of Electron Spectroscopy and Related Phenomena, 1983
- Quantitative analysis by X-ray photoelectron spectroscopy without reference samplesSpectrochimica Acta Part B: Atomic Spectroscopy, 1982
- Subshell photoionization cross-sections, electron mean free paths and quantitative X-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1980
- Hartree-Slater subshell photoionization cross-sections at 1254 and 1487 eVJournal of Electron Spectroscopy and Related Phenomena, 1976
- Relative intensities in photoelectron spectroscopy of atoms and moleculesJournal of Electron Spectroscopy and Related Phenomena, 1976
- Calculation methods for fluorescent x-ray spectrometry. Empirical coefficients versus fundamental parametersAnalytical Chemistry, 1968