Characterization of defect thiospinels Cu1−x[Ti2]S4 (0<x≤0.93)
- 28 February 1989
- journal article
- Published by Elsevier in Materials Research Bulletin
- Vol. 24 (2) , 143-155
- https://doi.org/10.1016/0025-5408(89)90118-9
Abstract
No abstract availableKeywords
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