Local mechanical spectroscopy with nanometer-scale lateral resolution
- 1 May 1998
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 69 (5) , 2085-2094
- https://doi.org/10.1063/1.1148903
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- Force modulation with a scanning force microscope: an analysisTribology Letters, 1997
- Scanning local-acceleration microscopyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1996
- Atomic force microscopy imaging of viscoelastic properties in toughened polypropylene resinsJournal of Applied Physics, 1995
- Imaging of Dynamic Viscoelastic Properties of a Phase-Separated Polymer Surface by Forced Oscillation Atomic Force MicroscopyMacromolecules, 1994
- Acoustic microscopy by atomic force microscopyApplied Physics Letters, 1994
- Nonlinear Detection of Ultrasonic Vibrations in an Atomic Force MicroscopeJapanese Journal of Applied Physics, 1993
- Scanning microdeformation microscopyApplied Physics Letters, 1993
- Using force modulation to image surface elasticities with the atomic force microscopeNanotechnology, 1991
- Role of interfaces in creep of fibre-reinforced metal-matrix composites—I. Continuous fibresActa Metallurgica et Materialia, 1991
- Atomic Force MicroscopePhysical Review Letters, 1986