Steady-state temperature profiles in narrow thin-film conductors
- 1 February 1985
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 57 (3) , 777-784
- https://doi.org/10.1063/1.334726
Abstract
Temperature profiles in sufficiently narrow thin‐film conductors can be computed in a quasi‐one‐dimensional model. The model applies when the linewidth is less than a thermal decay length. We discuss the thermal decay length as a function of geometrical and material parameters and find that many practical cases satisfy the narrow stripe criterion. Fringing effects are included in the model. Three specific examples are discussed: (i) the temperature of an isolated stripe, including fringing, (ii) temperature profiles near junctions of narrow stripes, and (iii) temperature profiles at the junction of a narrow tap and a wide stripe. The simplicity of the model makes it convenient for the design of electromigration experiments, for programmable read‐only memory fusing current calculations, etc. Examples and graphs are given for the case of passivated aluminum on SiO2. The graphs are useful for estimation of thermal parameters without calculation.This publication has 3 references indexed in Scilit:
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