Classification of secondary ion mass spectrometry (SIMS) micrographs to characterize chemical phases
- 1 March 1995
- journal article
- Published by Springer Nature in Microchimica Acta
- Vol. 119 (1-2) , 1-12
- https://doi.org/10.1007/bf01244849
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Segmentation and scatter diagram analysis of scanning Auger images ? A critical comparison of resultsAnalytical and Bioanalytical Chemistry, 1993
- Three dimensional ultra trace analysis of materialsMicrochimica Acta, 1992
- Image analysis in chemistry I. Properties of images, greylevel operations, the multivariate imageTrAC Trends in Analytical Chemistry, 1992
- High dynamic range quantitative image depth profiling of boron in patterned silicon dioxide on siliconJournal of Vacuum Science & Technology A, 1991
- Techniques for NMR imaging of solidsTrAC Trends in Analytical Chemistry, 1991
- Analytical applications of NMR imaging techniquesTrAC Trends in Analytical Chemistry, 1990
- Chemical microscopyAnalytical Chemistry, 1990
- Chemical imaging using ion microscopy and digital image processingJournal of Vacuum Science & Technology A, 1990
- Can image analysis provide information useful in chemistry?Journal of Chemometrics, 1989
- The new electron microscopy: imaging the chemistry of natureAnalytical Chemistry, 1988