Built-in self-test structures around cellular automata and counters

1 January 1990

journal article
Published by Institution of Engineering and Technology (IET) in IEE Proceedings E Computers and Digital Techniques

Vol. 137 (4) , 269-276
https://doi.org/10.1049/ip-e.1990.0033

Abstract

BIST structures for on-chip generation of random, exhaustive and deterministic test patterns have been discussed in the paper. Iso-morphism between maximal length LFSR and exhaustive CA has been established and the pseudorandomness properties of CAs in terms of well-suited autocorrelation functions have been investigated. Owing to the regularity in interconnection structure, additive group CA (cellular automata) offers advantages over LFSR. A method of covering deterministic test set by a counter-based scheme and its optimisation based on AT² complexity has been discussed.

Keywords

DETERMINISTIC TEST PATTERNS
PSEUDORANDOMNESS PROPERTIES
AT2 COMPLEXITY
BUILT-IN SELF TEST STRUCTURES
COUNTERS
AUTOCORRELATION FUNCTIONS
MAXIMAL LENGTH LFSR
ON-CHIP GENERATION
EXHAUSTIVE CA
CELLULAR AUTOMATA
ISOMORPHISM

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