High-speed electrical sampling by fs photoemission
- 11 August 1986
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 49 (6) , 357-359
- https://doi.org/10.1063/1.97586
Abstract
We propose and demonstrate a new method for contactless sampling of high-speed electrical signals, by spectral analysis of photoelectrons emitted when a signal-carrying conductor is illuminated by ultrashort light pulses. We present time-resolved measurements of sub-ns electrical signals on a gold transmission line on GaAs using three-photon photoemission induced by 80 fs visible laser pulses, and we discuss the temporal resolution of these measurements. This method is applicable to devices and circuits on any semiconductor.Keywords
This publication has 17 references indexed in Scilit:
- Direct electro-optic sampling of transmission-line signals propagating on a GaAs substrateElectronics Letters, 1984
- Subpicosecond electrical samplingIEEE Journal of Quantum Electronics, 1983
- Fundamentals of electron beam testing of integrated circuitsScanning, 1983
- Generation of optical pulses shorter than 0.1 psec by colliding pulse mode lockingApplied Physics Letters, 1981
- Picosecond optoelectronic detection, sampling, and correlation measurements in amorphous semiconductorsApplied Physics Letters, 1980
- Electron-beam testing of VLSI circuitsIEEE Journal of Solid-State Circuits, 1979
- Nonlinear photoelectric emission from metals induced by a laser radiationSoviet Physics Uspekhi, 1977
- Two-photon photoemission from metals induced by picosecond laser pulsesPhysical Review B, 1977
- Laser-Induced Electron Emission from Solids: Many-Photon Photoelectric Effects and Thermionic EmissionPhysical Review B, 1969
- Stroboscopic scanning electron microscopyJournal of Physics E: Scientific Instruments, 1968