Sampling and Analytical Characteristics of an Electrically Vaporized Thin-Film Plasma in an External Magnetic Field
- 1 January 1987
- journal article
- research article
- Published by SAGE Publications in Applied Spectroscopy
- Vol. 41 (1) , 131-139
- https://doi.org/10.1366/0003702874867972
Abstract
A magnetic field of a few kilogauss oriented normal to the electric field in the plasma generated by a capacitive discharge through a thin silver film is used to obtain an ExB drift motion of the plasma. The plasma current is used to generate the magnetic field in a coil surrounding the plasma. The plasma drift motion is used to confine the plasma to the region near the surface of the plastic substrate which originally supported the thin film and the powder or solution residue sample. The result is greater interaction of the plasma with the sample, as illustrated by more rapid vaporization of the sample, reduced effects of particle size on analyte radiation intensity, and significantly improved shot-to-shot reproducibility. While analyte line intensities frequently are lower in the ExB plasma, line-to-background intensity ratios may be greater if an optical mask is used to block radiation near the substrate surface.Keywords
This publication has 16 references indexed in Scilit:
- Direct powder injection of NBS coal fly ash in inductively coupled plasma atomic emission spectrometry with rapid scanning spectrometric detectionAnalytical Chemistry, 1984
- Expansion dynamics and vapor loss processes in electrically vaporized thin film atomization cellsAnalytical Chemistry, 1983
- Direct determination of metallic elements in solid, powder samples with electrically vaporized thin film atomic emission spectrometryAnalytical Chemistry, 1982
- Laser vaporization of solid metal samples into an inductively coupled plasmaSpectrochimica Acta Part B: Atomic Spectroscopy, 1982
- Direct trace elemental analysis of solids by atomic (absorption, fluorescence, and emission) spectrometryAnalytical Chemistry, 1980
- Direct sample insertion device for inductively coupled plasma emission spectrometryAnalytical Chemistry, 1979
- Direct analysis of solids by atomic-absorption spectrophotometry. A reviewThe Analyst, 1979
- Spark elutriation of powders into an inductively coupled plasmaSpectrochimica Acta Part B: Atomic Spectroscopy, 1978
- Computer Simulation of Inductively Coupled Plasma Discharge for Spectrochemical Analysis. II. Comparison of Temperature and Velocity Profiles, and Particle Decomposition for Inductively Coupled Plasma Discharges in Argon and NitrogenApplied Spectroscopy, 1976
- Emission spectroscopy of trace impurities in powdered samples with a high-frequency argon plasma torchAnalytica Chimica Acta, 1971