A laboratory technique for the evaluation of electrochemical transparent conductive oxide delamination from glass substrates
- 1 January 2003
- journal article
- research article
- Published by Elsevier in Thin Solid Films
- Vol. 423 (2) , 153-160
- https://doi.org/10.1016/s0040-6090(02)01020-9
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Electrochemical corrosion of SnO2:F transparent conducting layers in thin-film photovoltaic modulesSolar Energy Materials and Solar Cells, 2003
- Adhesion of PMDA-ODA polyimide to silicon oxide surface: sensitivity to fluorine contaminationJournal of Adhesion Science and Technology, 1988