Bound hydroxyl in vitreous silica
- 1 November 1977
- journal article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 67 (9) , 4260-4261
- https://doi.org/10.1063/1.435362
Abstract
A weak line at 969 cm−1 (941 cm−1) in the Raman spectrum of vitreous silica is shown to be due to the Si–O stretch vibration of OH (OD) groups. A triatomic molecular model for this defect accurately predicts the observed deuterated frequencies for both the Si–O and the O–D stretch vibrations bound to network silicon atoms.Keywords
This publication has 3 references indexed in Scilit:
- The radiation-induced formation of hydrogen and deuterium compounds in silica as observed by Raman scatteringThe Journal of Chemical Physics, 1977
- Water and its relation to broken bond defects in fused silicaThe Journal of Chemical Physics, 1976
- The Vibrational Properties of Disordered Systems: Numerical StudiesReviews of Modern Physics, 1972