Estimation of the thickness or composition of a covering layer on a solid by XPS or AES
- 31 December 1981
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 24 (2) , 243-253
- https://doi.org/10.1016/0368-2048(81)80011-4
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
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