Electron microscope structure and internal stress in thin silver and gold films deposited onto MgF2 and SiO substrates
- 1 April 1979
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 58 (2) , 365-370
- https://doi.org/10.1016/0040-6090(79)90272-4
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Structure and internal stress in ultra-thin silver films deposited on MgF2 and SiO substratesThin Solid Films, 1978
- Stresses in thin films: The relevance of grain boundaries and impuritiesThin Solid Films, 1976
- Recent developments in the study of mechanical properties of thin filmsThin Solid Films, 1972
- Grain Growth and Stress Relief in Thin FilmsJournal of Vacuum Science and Technology, 1972
- The internal stress in evaporated silver and gold filmsThin Solid Films, 1969