An effect of depth of focus on micrometric analysis
Open Access
- 1 September 1956
- journal article
- Published by Mineralogical Society in Mineralogical Magazine and Journal of the Mineralogical Society
- Vol. 31 (234) , 272-275
- https://doi.org/10.1180/minmag.1956.031.234.08
Abstract
Summary When using many patterns of integrating stage the depth of focus is so great that it is not possible to distinguish between the upper and lower surfaces of a thin section; this may introduce serious errors into micrometric analyses. A procedure to meet this difficulty is suggested.Keywords
This publication has 4 references indexed in Scilit:
- The Theory of Thin-Section AnalysisThe Journal of Geology, 1954
- The relation between area and volume in micrometric analysisMineralogical Magazine and Journal of the Mineralogical Society, 1953
- The ‘superposition error’ in the micrometric analysis of rocksMineralogical Magazine and Journal of the Mineralogical Society, 1952
- XV.On the theory of optical images, with special reference to the microscopeJournal of Computers in Education, 1896