An optical fiber-taper probe for wafer-scale microphotonic device characterization

1 January 2007

journal article
Published by Optica Publishing Group in Optics Express

Vol. 15 (8) , 4745-4752
https://doi.org/10.1364/oe.15.004745

Abstract

A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the “dimpled” taper controls the probe-sample interaction length and the level of noise present during coupling measurements. Practical demonstrations with high-Q silicon microcavities include testing a dense array of undercut microdisks (maximum Q = 3.3×10⁶) and a planar microring (Q = 4.8×10⁶).

Keywords

ARRAYS
OPTICAL AMPLIFICATION
OPTICAL FIBERS
PHASE MATCHING
PHOTONIC CRYSTAL WAVEGUIDES
SILICA FIBERS

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Version 1, 2007-02-09, ArXiv

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