INTERPRETATION OF TUNNEL EMISSION AND CAPACITANCE MEASUREMENTS IN THE PRESENCE OF DIELECTRIC FILM-THICKNESS FLUCTUATIONS
- 15 June 1966
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 8 (12) , 328-331
- https://doi.org/10.1063/1.1754462
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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- Effect of Insulating-Film-Thickness Nonuniformity on Tunnel CharacteristicsJournal of Applied Physics, 1963
- Generalized Formula for the Electric Tunnel Effect between Similar Electrodes Separated by a Thin Insulating FilmJournal of Applied Physics, 1963