High spatial resolution secondary ion imaging and secondary ion mass spectrometry of aluminium‐lithium alloys
- 1 December 1987
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 148 (3) , 241-252
- https://doi.org/10.1111/j.1365-2818.1987.tb02870.x
Abstract
SUMMARY: Samples of aluminium‐lithium alloys have been observed by scanning ion microscopy and analysed by secondary ion mass spectrometry. The high signal‐to‐noise ratio of the positive secondary lithium ion opens up the possibility of both high resolution imaging and microanalysis of lithium distributions in aluminium and other materials. Some of the problems encountered due to sample preparation are discussed and ion images of both the artefacts and the true lithium distribution are shown.Keywords
This publication has 8 references indexed in Scilit:
- The discontinuous precipitation reaction in dilute Al-Li alloysPublished by Elsevier ,2003
- Scanning ion microscopy: Elemental maps at high lateral resolutionApplied Surface Science, 1986
- Application of Digital SIMS Imaging to Light Element and Trace Element MappingPublished by Springer Nature ,1986
- Quantitative analysis of lithium in Al-Li alloys by ionization energy loss spectroscopyPhilosophical Magazine Part B, 1985
- Quantitative secondary ion mass spectrometry: A reviewSurface and Interface Analysis, 1980
- A high-intensity scanning ion probe with submicrometer spot sizeApplied Physics Letters, 1979
- The use of secondary ion mass spectrometry in surface analysisSurface Science, 1975
- Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline TargetsPhysical Review B, 1969