A xenon-filled multiwire arc detector for X-ray diffraction

• 1 September 1975
• journal article
• Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A
• Vol. 31  (5) , 702-703
• https://doi.org/10.1107/s0567739475001490

Abstract

Keywords

• PARENT
• HIGH AND UNIFORM
• HEAVY ATOM
• REFLECTION INTENSITIES
• ATOM DERIVATIVE
• DIFFRACTOMETER
• PHOTON DETECTION
• MULTIWIRE PROPORTIONAL