Statistical properties of the impulse response function of double-carrier multiplication avalanche photodiodes including the effect of dead space
- 1 October 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Journal of Lightwave Technology
- Vol. 10 (10) , 1415-1425
- https://doi.org/10.1109/50.166785
Abstract
The statistical properties of the impulse response function of double-carrier multiplication avalanche photodiodes (APDs) are determined, including the effect of dead space, i.e., the minimum distance that a newly generated carrier must travel in order to acquire sufficient energy to become capable of causing an impact ionization. Recurrence equations are derived for the first and second moments and the probability distribution function of a set of random variables that are related, in a deterministic way, to the random impulse response function of the APD. The equations are solved numerically to produce the mean impulse response, the standard deviation, and the signal-to-noise ratio (SNR), all as functions of time.<>Keywords
This publication has 16 references indexed in Scilit:
- Effect of dead space on gain and noise in Si and GaAs avalanche photodiodesIEEE Journal of Quantum Electronics, 1992
- Spectral properties of photocurrent fluctuations in avalanche photodiodesJournal of Lightwave Technology, 1992
- Effect of dead space on gain and noise of double-carrier-multiplication avalanche photodiodesIEEE Transactions on Electron Devices, 1992
- Effect of dead space on the excess noise factor and time response of avalanche photodiodesIEEE Transactions on Electron Devices, 1990
- Fiber OpticsPublished by Springer Nature ,1985
- Threshold energy effect on avalanche breakdown voltage in semiconductor junctionsSolid-State Electronics, 1975
- Ionization coefficients in semiconductors: A nonlocalized propertyPhysical Review B, 1974
- The distribution of gains in uniformly multiplying avalanche photodiodes: ExperimentalIEEE Transactions on Electron Devices, 1972
- Branching ProcessesPublished by Springer Nature ,1972
- New Results on Avalanche Multiplication Statistics with Applications to Optical DetectionBell System Technical Journal, 1971