Characterization of polymeric electro-optic films using metal mirror/electrode Fabry-Perot etalons

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Abstract
The electro-optic properties of polymeric materials are characterized using Fabry-Perot etalons in which the polymeric layer acts as the spacer layer. This technique is particularly useful since the etalon converts small electric field induced changes in the index of refraction of the spacer layer to changes in the overall transmittance and reflectance of the structure. In this paper we show that using angle tuning, the transmission characteristics of the Fabry-Perot etalons fabricated on glass substrates can be sufficiently characterized to allow for determination of the electro-optic coefficients of the spacer layer material. We also present experimental results of novel reflection mode etalons fabricated on Si. These structures exhibit a large change in reflectance as a function of the optical path length inside the etalon cavity. When fabricated with an electrooptic spacer layer, the reflectance can be modulated by applying an electric field. Reflection mode devices can also be used to study the properties of new eleciro-optic materials and also show promise for use as Si compatible modulators.

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