Angle-resolved x-ray photoelectron spectroscopy
- 1 January 1984
- journal article
- Published by Elsevier in Progress in Surface Science
- Vol. 16 (3) , 275-388
- https://doi.org/10.1016/0079-6816(84)90001-7
Abstract
No abstract availableKeywords
This publication has 129 references indexed in Scilit:
- Photoelectron diffraction effects in XPS angular distributions from GaAs(110) and Ge(110) single crystalsJournal of Electron Spectroscopy and Related Phenomena, 1981
- Relative intensities in x-ray photoelectron spectra: Part IV. The effect of elastic scattering in a solid on the free path of electrons and their angular distributionJournal of Electron Spectroscopy and Related Phenomena, 1979
- X-ray photoelectron diffraction: a new technique for structural studies of complex solidsJournal of the American Chemical Society, 1978
- Theory of Angle‐Resolved Photoemission. The Role of Electron Diffraction in the XPS SpectraPhysica Status Solidi (b), 1978
- X-ray photoelectron angular distributions with dispersion-compensating x-ray and electron opticsJournal of Electron Spectroscopy and Related Phenomena, 1977
- Surface analysis, peak intensities and angular distributions in XPSFaraday Discussions of the Chemical Society, 1975
- The probing depth in photoemission and auger-electron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1974
- Relative intensities in x-ray photoelectron spectraJournal of Electron Spectroscopy and Related Phenomena, 1973
- Theoretical electron scattering amplitudes and spin polarizations: Electron energies 100 to 1500 eV Part II. Be, N, O, Al, Cl, V, Co, Cu, As, Nb, Ag, Sn, Sb, I, and Ta targetsAtomic Data and Nuclear Data Tables, 1972
- Theoretical electron scattering amplitudes and spin polarizations: Selected targets, electron energies 100 to 1500 eVAtomic Data and Nuclear Data Tables, 1969