dV/dt Breakdown in power MOSFET's

• 1 January 1983
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters
• Vol. 4  (1) , 1-2
• https://doi.org/10.1109/edl.1983.25623

Abstract

Keywords

• ELECTRIC BREAKDOWN
• MOSFET CIRCUITS
• POWER MOSFET
• DVD
• SEMICONDUCTOR PROCESS MODELING
• SWITCHING CIRCUITS
• CIRCUIT TESTING
• IMMUNE SYSTEM
• EQUATIONS
• SWITCHING LOSS