Growth of Bi/Sb Superlattice
- 1 August 1992
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 31 (8A) , L1110
- https://doi.org/10.1143/jjap.31.l1110
Abstract
The present work describes the growth at room temperature of Bi, Sb and Bi-12 at.%Sb films on glass substrates and a Bi/Sb 40-layer superlattice film on a single-crystal Si (111) substrate. Thin-film X-ray diffractometer measurements strongly show the (003) orientation of these films. Four peaks are observed in small-angle X-ray diffraction measurements of the Bi/Sb superlattice film and indicate good periodicity. Direct transmission electron microscopy (TEM) observations also clearly show the superlattice structure.Keywords
This publication has 7 references indexed in Scilit:
- Growth of Bi/Sb Superlattice Films and RHEED Observation.SHINKU, 1992
- Growth and characterization of epitaxial bismuth filmsPhysical Review B, 1988
- Size and temperature effects on the Seebeck coefficient of thin bismuth filmsPhysical Review B, 1987
- Synthesis of Bi/Sb multilayer structuresPhysica Status Solidi (a), 1986
- X-ray diffraction study of a one-dimensional GaAs–AlAs superlatticeJournal of Applied Crystallography, 1977
- Galvanomagnetic Studies of Bismuth Films in the Quantum-Size-Effect RegionPhysical Review B, 1972
- Thermoelectric Power of Bismuth-Antimony AlloysJournal of the Physics Society Japan, 1961