Study of Scanning Near-Field Optical Microscopy (SNOM) by Nonlocal Response Theory

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Abstract
In the pursuit of higher resolution and signal intensity in SNOM by making use of resonant light, we propose to use a microscopic nonlocal theory of optical response, which allows a microscopic description of EM field down to atomic size. Model calculations are shown for various assemblies of spheres with resonant levels. It is demonstrated that the choice of light frequency at various resonances of the system reveals their characteristic near-field patterns, in contrast to the bias voltage dependence of STM. When the light frequency is resonant to a level of the whole system including probe tip, there can be an extreme distortion of image, because the resonant energy changes quickly as one scans the tip. We make a proposal to make a positive use of this effect as a new type of SNOM.

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