X-ray refraction-enhanced imaging and a method for phase retrieval for a simple object
- 25 April 2002
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Journal of Synchrotron Radiation
- Vol. 9 (3) , 160-165
- https://doi.org/10.1107/s090904950200554x
Abstract
Refraction-enhanced imaging is now widely used for imaging low-absorption-contrast specimens in the hard X-ray region. However, the interpretation of the details of a refraction-enhanced image is not always clear. In this paper the theoretical treatment of refraction-enhanced imaging and a method for phase retrieval from refraction-contrast images are discussed in comparison with angular-deflection mapping of the transmitting beam. The problems of thick and complicated objects are also discussed.Keywords
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