Influence of Ar, Kr, and Xe layers on the energies and lifetimes of image-potential states on Cu(100)

• 31 October 2003
• journal article
• research article
• Published by Springer Nature in Applied Physics A
• Vol. 78  (2) , 131-140
• https://doi.org/10.1007/s00339-003-2310-6

Abstract

Keywords

• DIELECTRIC CONSTANT
• LAYER THICKNESS
• FILM THICKNESS
• DYNAMICAL PROPERTY
• ATOMIC STRUCTURE