Characterization of S-glass/polysulfone adhesive failure using ion scattering spectroscopy and secondary ion mass spectrometry
- 1 March 1980
- journal article
- Published by Elsevier in Journal of Colloid and Interface Science
- Vol. 74 (1) , 150-162
- https://doi.org/10.1016/0021-9797(80)90178-2
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
- Characterization of glass surfaces by electron spectroscopySurface Science, 1975
- Fracture device for an x-ray photoelectron spectrometerJournal of Electron Spectroscopy and Related Phenomena, 1973
- Hydrolysis of triethylethoxysilane at the silica-carbon tetrachloride interfaceThe Journal of Physical Chemistry, 1972
- Determination of the Composition of Glass Surfaces by Auger SpectroscopyJournal of the American Ceramic Society, 1972
- Raman studies of the glass fiber-silane-resin interfaceJournal of Colloid and Interface Science, 1971
- The interaction of alkoxy silane coupling agents with silica surfacesPolymer Engineering & Science, 1971
- The glass transition temperature of filled polymers and its effect on their physical propertiesJournal of Applied Polymer Science, 1969
- Comparison of Surface and Bulk Glass Composition with the Spark Source Mass SpectrometerJournal of the American Ceramic Society, 1968
- Evidence for Chemical Bond Formation at Silane Coupling Agent InterfacesJournal of Composite Materials, 1967
- Surface Functionality of Amorphous Silica by Infrared SpectroscopyThe Journal of Physical Chemistry, 1958