Interface scattering as a source for diffuse interference in cuprous oxide on copper
- 30 June 1986
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 116 (7) , 343-346
- https://doi.org/10.1016/0375-9601(86)90586-4
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Observation of diffuse interference in reflectance from oxide-coated metalsThin Solid Films, 1985
- Optical properties and spectral selectivity of copper oxide on stainless steelSolar Energy Materials, 1984
- Relationship of the total integrated scattering from multilayer-coated optics to angle of incidence, polarization, correlation length, and roughness cross-correlation propertiesApplied Optics, 1983
- Properties of oxidized copper surfaces for solar applications IISolar Energy Materials, 1983
- Optical Properties of Some Metal Oxides in Solar AbsorbersPhysica Scripta, 1982