Precise measurements of $K α$ x-ray linewidths in Eu, Tm, and Ta

1 May 1978

journal article
research article
Published by American Physical Society (APS) in Physical Review A

Vol. 17 (5) , 1735-1738
https://doi.org/10.1103/physreva.17.1735

Abstract

The widths of

K α_{1}

and

K α_{2}

x rays in Eu, Tm, and Ta have been measured to an accuracy of (2-4)% with a high-resolution spectrometer by means of third- and fourth-order diffraction from the (111) crystalline planes of a bent silicon crystal. The measured values confirm the results from calculations of the radiative, Auger, and Coster-Kronig widths. Possible effects from hyperfine interaction, Coulomb exchange interaction, and chemical shift are discussed.

Keywords

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Precise measurements ofKαx-ray linewidths in Eu, Tm, and Ta

Abstract

Keywords

Precise measurements of $K α$ x-ray linewidths in Eu, Tm, and Ta