Direct Observation of Individual Dislocations by X-Ray Diffraction
- 1 March 1958
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 29 (3) , 597-598
- https://doi.org/10.1063/1.1723234
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- A method for the examination of crystal sections using penetrating characteristic X radiationActa Metallurgica, 1957
- Detection of dislocation by the Moiré pattern in electron micrographsActa Crystallographica, 1957
- Copper Precipitation on Dislocations in SiliconJournal of Applied Physics, 1956
- The direct study by electron microscopy of crystal lattices and their imperfectionsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1956