Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry
- 1 May 1997
- journal article
- Published by Trans Tech Publications, Ltd. in Materials Science Forum
- Vol. 248-249, 373-376
- https://doi.org/10.4028/www.scientific.net/msf.248-249.373
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: