Central temperature of convecttvely cooled thin targets during ion beam analysis
- 1 August 1990
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 51 (2) , 196-197
- https://doi.org/10.1016/0168-583x(90)90523-w
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Specimen damage by nuclear microbeams and its avoidanceNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
- Control of temperature in thin samples during ion beam analysisNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
- The use of the PIXE technique with nuclear microprobesNuclear Instruments and Methods, 1981
- Proton Microprobes and Particle-Induced X-Ray Analytical SystemsAnnual Review of Nuclear and Particle Science, 1980