An uncertainty analysis for the measurement of microwave conductivity and dielectric constant by the short-circuited line method
- 1 March 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. IM-35 (1) , 36-41
- https://doi.org/10.1109/tim.1986.6499053
Abstract
The uncertainties of conductivity σ and dielectric constant є of the short-circuited tine (SCL) method due to the measured errors in the VSWR and the position of standing-wave minimum are studied. In order to cover most of the fast ion conductors, the range of σ from 10−4 to 1.0 (Ω cm) is considered. The results of the s nah si s provide the order of accuracy one can achieve in these measurements. The effect of sample thickness, high conductivity, and negative dielectric constant upon uncertainity are examined. Measurements on a chloroben-zene sample are used to simulate this analysis. A relationship between σ, є, and operating frequency is derived which allows us to determine the limit of application of the SCL method.This publication has 0 references indexed in Scilit: