Abstract
Attenuated total reflection (ATR) FTIR spectroscopy has been used to study the diffusion of water into sulfonated poly(ether sulfone) films as a function of film thickness, preparation solvent and degree of sulfonation. Dual mode diffusion is found in all cases with diffusion coefficients D1 and D2 and weighting factor x1 which vary depending on the conditions. Variations with film thickness are thought to be due to the way in which information is weighted towards the D1 and D2 modes. Changes in D with preparation solvent are due to the degree of ion solvation, cluster formation and subsequent ability to interact with water. Changes in D with degree of sulfonation are easily attributed to interfacial activity of water and therefore the greater the weighting of the D1 mode at higher SO3 level.