Study on X-Ray Stress Analysis Using a New Position-Sensitive Proportional Counter
- 1 January 1978
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 22, 233-240
- https://doi.org/10.1154/s0376030800016591
Abstract
A position-sensitive proportional counter suitable for the X-ray stress measurement has been developed and residual stresses were measured with an apparatus that uses this PSD system. The counter was designed to have a good angular resolution over the counter length for the diffracted X-ray beam and high counting rates. The mean angular resolution measured was about 0.2° in 2θ (FWHM) at 200 mm, and the maximum allowable counting rate reached about 40,000 cps. The time required for the data accumulation was shown to be 1/10 to 1/30 of the time required with a standard diffractometer.Keywords
This publication has 2 references indexed in Scilit:
- A two-dimensional position-sensitive detector for thermal neutronsNuclear Instruments and Methods, 1975
- The Application of a Position-Sensitive X-Ray Detector to the Measurement of Residual StressesAdvances in X-ray Analysis, 1975